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Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies) download epub

by Richard Leach


Epub Book: 1997 kb. | Fb2 Book: 1133 kb.

Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing .

He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty.

ISBN 13: 9781455777532. Series: Micro and Nano Technologies. File: PDF, 2. 9 MB. Читать онлайн.

This book is an essential guide for the emerging nanomanufacturing and nanofabrication sectors, where measurement and standardization requirements are paramount both in product specification and quality assurance. ISBN 13: 9781455777532.

The principles of engineering metrology applied to the micro- and nanoscale: essential reading for all scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale

The principles of engineering metrology applied to the micro- and nanoscale: essential reading for all scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale. The establishment of common standards will be an essential key to unlocking the commercial potential of Micro- and Nanotechnologies (MNT), enabling fabrication plants to interchange parts, packaging and design rules. Effectively MNT standardization will provide the micro- and nanoscale equivalents of macro-scale nuts and bolts or house bricks

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In this book Professor Richard Leach, of the UK's National Physical Laboratory (NPL) makes a significant contribution to. .

In this book Professor Richard Leach, of the UK's National Physical Laboratory (NPL) makes a significant contribution to standardization in the field of MNT, extending the principles of engineering metrology to the micro- and nanoscale, with a focus on dimensional and mass metrology. The principles of engineering metrology applied to the micro- and nanoscale: essential reading for all scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale.

Nanotechnology and nanometrology strategie.

Stay ahead with the world's most comprehensive technology and business learning platform. With Safari, you learn the way you learn best. Chapter 1. Introduction to Metrology for Advanced Manufacturing and Micro- and Nanotechnology.

series Micro and Nano Technologies. Books related to Fundamental Principles of Engineering Nanometrology.

Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how .series Micro and Nano Technologies.

Richard Leach There is a major thrust in standardisation for micro- and nanotechnology.

This chapter introduces nanotechnology and advanced manufacturing, and discusses their metrology requirements. Nanotechnology and nanometrology strategies for a handful of countries are discussed along with a brief introduction to the standardisation efforts worldwide. There is a major thrust in standardisation for micro- and nanotechnology (MNT) activities in many national and regional committees.

Start by marking Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies) as Want to Read .

Start by marking Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies) as Want to Read: Want to Read savin. ant to Read.

Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study.Provides a basic introduction to measurement and instruments Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal , variable focus, and scattering instruments) Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge

Comments: (2)

Fek
In this outstanding book, Professor Richard Leach presents a comprehensive overview of engineering nanometrology and how it is related to micro-/nano-technology and manufacturing.

Professor Richard Leach, who has been with National Physical Laboratory (NPL), UK, since 1990, is one of the leaders in the field of nanometrology over the world. This book is written based on Professor Richard's long experience and solid knowledge in this field. I know his research work well through reading his large number and high quality academic papers, listening to his keynote speeches in international conferences, making face-to-face discussions with him in various occasions. I am always impressed by his depthful insight and wide knowledge in nanometrology. I believe you will feel the same after you have read this book.

This book provides fundamental principles of engineering nanometrology, covering numerous measurement techniques, from static length and displacement to surface topography, mass and force. The principle, design and calibration of surface measuring instruments, including optical systems, scanning probe and particle beam microscopy, are described in depth. The whole book is easy to understand for those even with a limited mathematical knowledge.

This book will be essential and beneficial for researchers, engineers and students who are involved in nanometrology and related engineering areas.
Stan
This is a superb text on micro- and nano- scale metrology. I am currently completing my PhD in a similar research area and I use this text often as it covers a wide range of techniques, both fundamental and advanced. The diagrams are particularly clear and the mathematics, although advanced, is easy to follow and very useful.
The references are also exhaustive, providing endless further reading on this and related subjects.
I highly recommend this book for anyone who is facing challenges at the micro- and nano- scale.
Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies) download epub
Engineering
Author: Richard Leach
ISBN: 0080964540
Category: Engineering & Transportation
Subcategory: Engineering
Language: English
Publisher: William Andrew; 1 edition (October 9, 2009)
Pages: 352 pages